Cleavelin, R.: search on Z-Library

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1

Transverse-ultrasonic-attenuation determination of the energy gap between the normal and superconducting states of zinc

Breashears, E. H., Cleavelin, C. R., Marshall, B. J.

Journal:

Physical Review B

Year:

1976

Language:

english

File:

PDF, 431 KB

english, 1976

2

[IEEE 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Univ. of Texas at Dallas, Richardson, TX, USA (2006.10.29-2006.10.30)] 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Ring Oscillator Performance and Parasitic Extraction Simulation in Finfet Technology

Kulkarni, Mak, Marshall, Andrew, Cleavelin, C., Xiong, Weize, Pacha, Christian, Armin, Klaus, Schulz, Thomas, Schruefer, Klaus, Patruno, Paul

Year:

2006

Language:

english

File:

PDF, 225 KB

english, 2006

3

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unique ESD Failure Mechanism in a MuGFET Technology

Gossner, Harald, Russ, Christian, Siegelin, Frank, Schneider, Jens, Schruefer, Klaus, Schulz, Thomas, Duvvury, Charvaka, Cleavelin, C. Rinn, Xiong, Weize

Year:

2006

Language:

english

File:

PDF, 2.80 MB

english, 2006

4

Elastic Constants of RbF from 300 to 4.2 K

Cleavelin, C. R., Pederson, D. O., Marshall, B. J.

Journal:

Physical Review B

Year:

1972

Language:

english

File:

PDF, 388 KB

english, 1972

5

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - BSIM-MG: A Versatile Multi-Gate FET Model for Mixed-Signal Design

Dunga, Mohan V., Lin, Chung-Hsun, Lu, Darsen D., Xiong, Weize, Cleavelin, C. R., Patruno, P., Hwang, Jiunn-Ren, Yang, Fu-Liang, Niknejad, Ali M., Hu, Chenming

Year:

2007

Language:

english

File:

PDF, 884 KB

english, 2007

6

[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Full/partial depletion effects in FinFETs

Xiong, W., Cleavelin, C.R., Wise, R., Yu, S., Pas, M., Zaman, R.J., Gostkowski, M., Matthews, K., Maleville, C., Patruno, P., Tsu-Jae King,, Colinge, J.P.

Year:

2004

Language:

english

File:

PDF, 232 KB

english, 2004

7

Ultrasonic-attenuation determination of the anisotropic energy gap in superconducting zinc

Cleavelin, C. R., Marshall, B. J.

Journal:

Physical Review B

Year:

1974

Language:

english

File:

PDF, 913 KB

english, 1974

8

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Multigate SOI MOSFETs: Accumulation-mode vs. enhancement-mode

Afzalian, A., Lederer, D., Lee, C.-W, Yan, R., Xiong, W., Cleavelin, C. Rinn, Colinge, J.-P.

Year:

2008

Language:

english

File:

PDF, 921 KB

english, 2008

9

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Design of FinFET SRAM Cells Using a Statistical Compact Model

Lu, Darsen D., Lin, Chung-Hsun, Yao, Shijing, Xiong, Weize, Bauer, Florian, Cleavelin, Cloves R., Niknejad, Ali M., Hu, Chenming

Year:

2009

Language:

english

File:

PDF, 505 KB

english, 2009

10

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Self Heating Simulation of Multi-Gate FETs

Molzer, W., Schulz, Th., Xiong, W., Cleavelin, R., Schrufer, K., Marshall, A., Matthews, K., Sedlmeir, J., Siprak, D., Knoblinger, G., Bertolissi, L., Patruno, P., Colinge, J.-p.

Year:

2006

Language:

english

File:

PDF, 1.32 MB

english, 2006

11

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Global parameter extraction for a multi-gate MOSFETs compact model

Yao, Shijing, Morshed, Tanvir H., Lu, Darsen D., Venugopalan, Sriramkumar, Xiong, Weize, Cleavelin, C. R., Niknejad, Ali M., Hu, Chenming

Year:

2010

Language:

english

File:

PDF, 1.27 MB

english, 2010

12

ESD Evaluation of the Emerging MuGFET Technology

Russ, C., Gossner, H., Schulz, T., Chaudhary, N., Weize Xiong,, Marshall, A., Duvvury, C., Schrufer, K., Rinn Cleavelin, C.R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 1.49 MB

english, 2007

13

[IEEE 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Montreaux, Switzerland (2006.09.19-2006.09.21)] 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Multi-Gate MOSFET Design

Knoblinger, G., Pacha, C., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Arnim, K., Engelstaedter, J.P., Bertolissi, L., Xiong, W., Cleavelin, C.R., Schruefer, K.

Year:

2006

Language:

english

File:

PDF, 972 KB

english, 2006

14

[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Efficiency of low-power design techniques in Multi-Gate FET CMOS Circuits

Pacha, C., von Arnim, K., Bauer, F., Schulz, T., Xiong, W., San, K.T., Marshall, A., Baumann, T., Cleavelin, C.-R., Schruefer, K., Berthold, J.

Year:

2007

Language:

english

File:

PDF, 1.10 MB

english, 2007

15

Junction Passivation for Direct Silicon Bond Hybrid Orientation Technology

Joshi, S., Pinto, A., Huang, Y.-T., Wise, R., Cleavelin, R., Seacrist, M., Ries, M., Ramin, M., Freeman, M., Nguyen, B., Matthews, K., Wilks, B., Denning, L., Johnson, C., Bennet, J., Ma, M., Lin, C.-

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 626 KB

english, 2007

16

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Evaluation of FinFET RF Building Blocks

Knoblinger, G., Fulde, M., Siprak, D., Hodel, U., Von Arnim, K., Schulz, Th., Pacha, C., Baumann, U., Marshall, A., Xiong, W., Cleavelin, C. R., Patruno, P., Schruefer, K.

Year:

2007

Language:

english

File:

PDF, 289 KB

english, 2007

17

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Multi-Gate SOI MOSFET Operations in Harsh Environments

Xiong, W., Cleavelin, C. R., Hsu, C.H., Ma, M., Schulz, T., Schruefer, K., Patruno, P., Colinge, J.P.

Year:

2007

Language:

english

File:

PDF, 1.29 MB

english, 2007

18

[IEEE IEEE International Solid-State Circuits Conference - New York, NY, USA (15-17 Feb. 1989)] IEEE International Solid-State Circuits Conference - A 5 V-only 256 kbit CMOS flash EEPROM

D'Arrigo, S., Imondi, G., Santin, G., Gill, M., Cleavelin, R., Spagliccia, S., Tomassetti, E., Lin, S., Nguyen, A., Shah, P., Savarese, G., McElroy, D.

Year:

1989

Language:

english

File:

PDF, 365 KB

english, 1989

19

Low-temperature electron mobility in Trigate SOI MOSFETs

Colinge, J.-P., Quinn, A.J., Floyd, L., Redmond, G., Alderman, J.C., Weize Xiong, Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 285 KB

english, 2006

20

Preparation, Characterization, and Damage-Free Processing of Advanced Multiple-Gate FETs

Lauerhaas, Jeffrey M., Cleavelin, Rinn, Xiong, Wei Ze, Mochizuki, Koki, Sherman, Kara, Lee, Hu Cheng, Clappin, Brian, Schulz, Thomas, Schruefer, Klaus

Journal:

Solid State Phenomena

Year:

2008

Language:

english

File:

PDF, 971 KB

english, 2008

21

Improved hot-electron reliability in strained-Si nMOS

Onsongo, D., Kelly, D.Q., Dey, S., Wise, R.L., Cleavelin, C.R., Banerjee, S.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 768 KB

english, 2004

22

Study of bending-induced strain effects on MuGFET performance

Shin, K., Weize,, Chung Yeung Cho,, Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P., Smith, L., Tsu-Jae King Liu,

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 316 KB

english, 2006

23

Front end of line considerations for progression beyond the 100 nm node ultrashallow junction requirements

C. Rinn Cleavelin, B. C. Covington, L. A. Larson

Year:

2000

Language:

english

File:

PDF, 437 KB

english, 2000

24

[IEEE 1999 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings - Boston, MA, USA (8-10 Sept. 1999)] 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) - The Virtual Fab the core of future technology development

Torres, K., Smith, E., McDonald, C., Rinn Cleavelin, C.

Year:

1999

Language:

english

File:

PDF, 434 KB

english, 1999

25

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Experimental Hardware Calibrated Compact Models for 50nm n-channel FinFETs

Song, Jooyoung, Yu, Bo, Xiong, W., Hsu, C.H., Cleavelin, C.R., Ma, M., Patruno, P., Taur, Yuan

Year:

2007

Language:

english

File:

PDF, 553 KB

english, 2007

26

[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - A novel sublithographic tunnel diode based 5V-only flash memory

Gill, M., Cleavelin, R., Lin, S., Middendorf, M., Nuyen, A., Wong, J., Huber, B., D'Arrigo, S., Shah, P., Kougianos, E., Hefley, P., Santin, G., Naso, G.

Year:

1990

Language:

english

File:

PDF, 279 KB

english, 1990

27

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Multi-Gate MOSFETs with Dual Contact Etch Stop Liner Stressors on Tensile Metal Gate and Strained Silicon on Insulator (sSOI)

Hsu, Che-Hua, Xiong, Weize, Lin, Chien-Ting, Huang, Yao-Tsung, Ma, Mike, Cleavelin, C.R, Patruno, Paul, Kennard, Mark, Cayrefourcq, Ian, Shin, Kyoungsub, Liu, Tsu-Jae King

Year:

2007

Language:

english

File:

PDF, 910 KB

english, 2007

28

[IEEE SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Cambridge, MA, USA (13-15 Nov. 1995)] Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Rapid thermal processing (RTP) applied to ion implant anneal for 0.25 μm technology

Hossain, S.D., Pas, M.F., Miner, G., Cleavelin, C.R.

Year:

1995

Language:

english

File:

PDF, 250 KB

english, 1995

29

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Gate Dielectric Integrity along the Road Map of CMOS Scaling including Multi-Gate Fet, TiN Metal Gate, and HfSiON High-k Gate Dielectric

Pompl, T., Mogul, H., Kerber, M., Haase, G., Ogawa, E., McPherson, J., Xiong, W., Schulz, T., Schrufer, K., Cleavelin, R.

Year:

2006

Language:

english

File:

PDF, 2.57 MB

english, 2006

30

[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Special effects in triple gate MOSFETs fabricated on silicon-on-insulator (SOI)

Bae, Y., Na, K-I, Cristoloveanu, S., Xiong, W., Cleavelin, C. R., Lee, J-H

Year:

2009

Language:

english

File:

PDF, 597 KB

english, 2009

31

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Advances in Multi-Gate MOSFET Circuit Design

Fulde, M., Arnim, K. v., Pacha, C., Bauer, F., Russ, C., Siprak, D., Xiong, W., Marshall, A., Cleavelin, C. R., Schruefer, K., Schmitt-Landsiedel, D., Knoblinger, G.

Year:

2007

Language:

english

File:

PDF, 1.35 MB

english, 2007

32

Improvement of FinFET Electrical Characteristics by Hydrogen Annealing

Xiong, W., Gebara, G., Zaman, J., Gostkowski, M., Nguyen, B., Smith, G., Lewis, D., Cleavelin, C.R., Wise, R., Yu, S., Pas, M., King, T.-J., Colinge, J.P.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 339 KB

english, 2004

33

[IEEE 1989 Proceedings of the IEEE Custom Integrated Circuits Conference - San Diego, CA, USA (1989.05.15-1989.05.18)] 1989 Proceedings of the IEEE Custom Integrated Circuits Conference - A five-volt only flash EEPROM technology for high density memory and system IC applications

Gill, M., Cleavelin, R., Lin, S., D'Arrigo, I., Santin, G., Shah, P., Nguyen, A., Lahiry, R., DeSimone, P., Piva, G., Paterson, J.

Year:

1989

Language:

english

File:

PDF, 256 KB

english, 1989

34

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Design and Evaluation of Basic Analog Circuits in an Emerging MuGFET Technology

Knoblinger, G., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Xiong, W., Gostkowski, M., Schruefer, K., Cleavelin, C.R.

Year:

2005

Language:

english

File:

PDF, 2.09 MB

english, 2005

35

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Enhanced hot-electron performance of strained Si NMOS over unstrained Si

Kelly, D.Q., Onsongo, D., Dey, S., Wise, R., Cleavelin, R., Banerjee, S.K.

Year:

2004

Language:

english

File:

PDF, 418 KB

english, 2004

36

[IEEE SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Cambridge, MA, USA (13-15 Nov. 1995)] Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop - A model for intra industry, supplier, and SEMATECH collaboration including an inter-group effort by industry

Hossain, S.D., Pas, M.F., Cleavelin, R., Robinson, R., Miner, G., Nanda, A.

Year:

1995

Language:

english

File:

PDF, 320 KB

english, 1995

37

[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - Characterization of HfSiON Gate Dielectric with TiN Gate on Multi-Gate MOSFET

Weize Xiong,, Chadwin Young,, Matthew, K., Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P.

Year:

2006

Language:

english

File:

PDF, 2.83 MB

english, 2006

38

Radiation Dose Effects in Trigate SOI MOS Transistors

Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrfer, K., Knoblinger, G., Patruno, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.27 MB

english, 2006

39

Fin Sidewall Microroughness Measurement by AFM

Gondran, Carolyn F. H., Morales, Emily, Guerry, Angela, Xiong, Weize, Cleavelin, C. Rinn, Wise, Rick, Balasubramanian, Sriram, King, Tsu-Jae

Journal:

MRS Proceedings

Year:

2004

Language:

english

File:

PDF, 210 KB

english, 2004

40

Elastic constants of LiBr from 300° to 4.2°K

B.J. Marshall, C.R. Cleavelin

Journal:

Journal of Physics and Chemistry of Solids

Year:

1969

Language:

english

File:

PDF, 253 KB

english, 1969

41

Reply Briefs

Richard P. Glovka, Donald L. Cox, Philip J. Englund, Patrick J. Gibbs, Leonard R. Cleavelin, Robert D. Sundby and Franklin N. Cunningham

Journal:

Year:

1984

Language:

english

File:

PDF, 734 KB

english, 1984

42

Impact of Gate-Induced Strain on MuGFET Reliability

Nathanael, Rhesa, Xiong, Weize, Cleavelin, C. Rinn, Liu, Tsu-Jae King

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 592 KB

english, 2008

43

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Multi-Gate MOSFET Design

Knoblinger, G., Pacha, C., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Arnim, K., Engelstaedter, J.P., Bertolissi, L., Xiong, W., Cleavelin, C.R., Schruefer, K.

Year:

2006

Language:

english

File:

PDF, 995 KB

english, 2006

44

Impact of strained-silicon-on-insulator (sSOI) substrate on FinFET mobility

Xiong, W., Cleavelin, C.R., Kohli, P., Huffman, C., Schulz, T., Schruefer, K., Gebara, G., Mathews, K., Patruno, P., Le Vaillant, Y.-M., Cayrefourcq, I., Kennard, M., Mazure, C., Shin, K., Liu, T.-J.K

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 295 KB

english, 2006

45

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - MuGFET carrier mobility and velocity: Impacts of fin aspect ratio, orientation and stress

Nuo Xu,, Xin Sun,, Weize Xiong,, Rinn Cleavelin, C., Tsu-Jae King Liu,

Year:

2010

Language:

english

File:

PDF, 509 KB

english, 2010

46

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Comparison of Short-Channel Effects in SOI and sSOI Triple-Gate MOSFETs

Na, Kyoung Il, Cristoloveanu, S., Bae, Young Ho, Xiong, Wade, Cleavelin, C. Rinn, Patruno, Paul, Lee, Jung Hee

Year:

2009

Language:

english

File:

PDF, 830 KB

english, 2009

47

Full∕partial depletion effects in FinFETs

Xiong, W., Rinn Cleavelin, C., Wise, R., Yu, S., Pas, M., Zaman, R.J., Gostkowski, M., Matthews, K., Maleville, C., Patruno, P., King, T.-J., Colinge, J.P.

Journal:

Electronics Letters

Year:

2005

Language:

english

File:

PDF, 92 KB

english, 2005

48

[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Intrinsic Advantages of SOI Multiple-Gate MOSFET (MuGFET) for Low Power Applications

Xiong, Weize W., Cleavelin, C. Rinn, Hsu, Che-Hua, Ma, Mike, Schruefer, Klaus, Von Arnim, Klaus, Schulz, Thomas, Cayrefourcq, Ian, Mazure, Carlos, Patruno, Paul, Kennard, Mark, Shin, Kyoungsub, Xin, S

Year:

2007

Language:

english

File:

PDF, 1.64 MB

english, 2007

49

Body Effect in Tri- and Pi-Gate SOI MOSFETs

Frei, J., Johns, C., Vazquez, A., Xiong, W., Cleavelin, C.R., Schulz, T., Chaudhary, N., Gebara, G., Zaman, J.R., Gostkowski, M., Matthews, K., Colinge, J.-P.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 291 KB

english, 2004

50

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Fin Thickness Asymmetry Effects in Multiple-Gate SOI FETs (MuGFETs)

Schulz, T., Xiong, W., Cleavelin, C.R., Schruefer, K., Gostkowski, M., Matthews, K., Gebara, G., Zaman, R.J., Patruno, P., Chaudhry, A., Woo, A., Colinge, J.P.

Year:

2005

Language:

english

File:

PDF, 1.57 MB

english, 2005

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